Description
MarSurf VD 280 Roughness and Contour Measuring Station
Innovative technologies:
Fast axes
- Positioning speeds up to 200 mm/s in X
- Contour measurements are 25 x faster than with its predecessor MarSurf PCV or MarSurf CD 120
- Surface measurements are 40 x faster than with the MarSurf GD 120
- By default, the Z-axis is fully CNC-capable
- The Z-axis is approx. twice as fast as previous Mahr Z-axes
- Up to 5 times faster than standard Z-axes on the market
Two reference probe systems for your measuring tasks
Contour probe system C 11
- Probe arm recognition via integrated chip
- Standard measuring range up to 70 mm; Max. 100 mm with 490 mm probe arm length
- Magnetic probe arm holder, probe arm change without tools
- The touch probe combines robustness with dynamics
- Optional: Possibility to extend the roughness value determination to contours
Roughness probe system BFW
- Easy probe arm change and probe arm protection by means of magnetic probe arm holder
- Probe arm mount allows the change from standard to transverse measurement without tools or adapter
- Extensions for the probe system possible
Innovative workpiece clamping system
- Mounting plate 390 x 430 mm with hole dimension 50 mm
- Integrated 60 mm TY adjustment
- The combination of mounting plate and integrated TY adjustment makes an additional XY table superfluous
- Low workpiece setup supports a favorable short measurement loop, which has a positive effect on the measurement results