Description
Foerster DEFECTOMETER® M 1.837
crack test instrument
Your advantages at a glance
- High sensitivity with a defect resolution from 20 µm
- Simple operation
- Automatic lift-off, zero, and tilt compensation
- Warning for lifted off probe
- Very good legibility of the LED scale display and the LCD display
- 35-hour operation with activated backlighting
- USB port for the visualization and documentation of the measurement results
- Probes from earlier DEFECTOMETERs can be used