Helmut-Fischer FISCHERSCOPE® X-RAY XDV®-SDD

X-ray fluorescence analysis for universally highest demands.

The FISCHERSCOPE® X-RAY XDV®-SDD is one of the most powerful X-ray fluorescence instruments in the Fischer portfolio. Take your measurement performance to a new level with this premium model. In combination with our in-house developed digital pulse processor DPP+, even higher count rates can now be processed, resulting in reduced measuring times or improved repeatability of your measurement results.

Powerful XRF measuring device for universal use in the inspection of very thin or complex layers and performing RoHS screening at very low detection limits.

• Built to last. 

Robust design for particularly high requirements

• Fully automatable.

Let your device work for you with just one click

• Quick-measure design.

With a few simple steps, the sample is placed and ready for measurement. Automated measurements of many parts are possible

• Fast.

Thanks to short measuring times, you save valuable time

• RoHS analysis.

Determination of pollutants with high detection accuracy and outstanding performance

• DPP+ digital pulse processor.

Shorter measuring times or improvement of standard deviation*
*compared to the DPP

• Microfocus tube with tungsten anode
• Silicon drift detector 50 mm² with extra-large effective area of 50 mm²
• Determination of metal content in electroplating baths with corresponding accessories
• Measuring spot approx.: Ø 0.25 mm
• Higher count rates and significantly reduced measurement times thanks to DPP+
• Type approved full protection device
• Up to 140 mm possible height of samples
• 4-fold changeable apertures and 6-fold changeable filters

• Measuring functional coatings in the electronics and semiconductor industry, e.g. determining the thickness of gold coatings down to 2 nm
• Analysis of thin and very thin coatings in the electronics and semiconductor industry, such as gold/palladium layers of ≤ 0.1 μm
• Determination of complex multilayer systems
• Coating thickness measurement for photovoltaics, fuel cell and battery cell applications
• Trace analyses of hazardous substances such as lead and cadmium according to RoHS, WEEE, CPSIA and other directives for electronics, packaging and consumer products
• Analysis and authenticity check of gold and other precious metals and precious metal alloys
• Direct determination of phosphorus content in functional NiP layers
• Determination of the metal content of electroplating baths