Helmut-Fischer FISCHERSCOPE X-RAY XDL and XDLM Series, XRF
The all-rounder: with comprehensive configuration options, XDL instruments are ideal for manual measurements or serial testing of coating thicknesses and material compositions.
With motor-driven axes (optional) and measurement direction from top to bottom, the measurement instruments from the XDL® range enable automated serial tests. A variety of versions – differing in their X-ray source, filter, aperture and detector – make it possible to select the X-ray device with the configuration that best suits your specific measurement task.
Features
X-ray fluorescence instruments for a variety of measurement tasks, made possible through different hardware components
Also suitable for testing assembled circuit boards or parts with indentations, due to the variable measuring distance (up to 80 mm)
Automated serial testing with programmable XY-table and Z-axis (optional)
Ideal for the measurement of very thin layers using the silicon drift detector with high energy resolution (XDAL device)
Applications
Coating Thickness Measurement
Measurement of coatings on large boards and flexible circuit boards (flex PCBs)
Thin conductive and/or separating layers on circuit boards
Coatings on three-dimensional components
Chrome coatings, for example plastic items with decorative chrome finish
Material Analysis
Analysis of electroplating baths
Analysis of functional coatings in the electronics and semiconductor industry
Analysis of hard material coatings, for example CrN, TiN or TiCN
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