Description
MarSurf XR 1 Roughness measuring station
- Over 80 surface parameters for R-, P- and W-profiles according to current ISO/JIS or MOTIF standards (ISO 12085)
- Bandpass filter Ls in accordance with current standard; Ls can also be switched off or varied as required
- Comprehensive measuring records
- Teach-in methods for the rapid creation of Quick&Easy measuring programs
- Automatic functions for choosing cut-off and traversing length in accordance with standards
- Support for various calibration methods (static and dynamic) by specifying the Ra or Rz parameter
- Adjustable maintenance and calibration intervals
- Multiple measuring station configurations for custom applications
- Range of options provide system flexibility
- Various user levels protect the device against misuse and prevent unauthorized people from using it