Description
MarSurf XC 2 mit CD 120 Contour measuring station
Technical data
9999340 – MESSPLATZ XC 2 MarWin MarSurf
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9036396 – Messplatz MarSurf XC 2 mit ST 500 ohne PC
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Resolution
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In Z, relative to stylus tip: 0.38 µm (350 mm probe arm) / 0.19 µm (175 mm probe arm)
In Z, relative to measuring system: 0.04 µm |
In Z, relative to stylus tip: 0.38 µm (350 mm probe arm) / 0.19 µm (175 mm probe arm)
In Z, relative to measuring system: 0.04 µm |
Sampling angle
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On smooth surfaces, depending on deflection: trailing edges up to 88°, leading edges up to 77°
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On smooth surfaces, depending on deflection: trailing edges up to 88°, leading edges up to 77°
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Start of traversing length (in X)
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0.2 mm
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0.2 mm
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Tip radius
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25 µm
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25 µm
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Contacting speed (in Z)
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0.1 to 1 mm/s
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0.1 to 1 mm/s
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Probe arm length
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175 mm, 350 mm
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175 mm, 350 mm
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End of traversing length (in X)
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120 mm
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120 mm
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Positioning speed
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In X and return speed: 0.2 to 8 mm/s
In Z: 0.2 to 10 mm/s |
In X and return speed: 0.2 to 8 mm/s
In Z: 0.2 to 10 mm/s |
Guide deviation
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< 1 µm (over 120 mm)
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< 1 µm (over 120 mm)
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Measuring speed
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0.2 mm/s to 4 mm/s
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0.2 mm/s to 4 mm/s
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Measuring range mm
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(in Z) 50 mm
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(in Z) 50 mm
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Traversing lengths
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0.2 mm to 120 mm
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0.2 mm to 120 mm
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Measuring force (N)
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1 mN to 120 mN
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1 mN to 120 mN
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