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MAHR MarOpto Fizeau Interferometers

  • MarOpto FI 1040 Z
  • MarOpto FI 1100 Z
  • MarOpto FI 1150 Z
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Description

MarOpto FI 1040 Z Fizeau interferometer

MarOpto FI 1040 Z Fizeau interferometer

The MarOpto FI 1040 Z is a powerful interferometer that can provide contactless measurements on flats and spherical surfaces and of transmitted wavefronts. The MarOpto FI 1040 Z is ideal for measuring optical components such as flats, prisms and lenses or precision metal workpieces including bearings, sealing surfaces and polished ceramics. Measurements can be performed by means of simple interference fringe detection, IntelliPhase static spatial carrier analysis, or phase-modulated interferogram analysis. The MarOpto FI 1040 Z offers the flexibility and excellent performance that today’s industrial applications demand.

 

 

The MarOpto FI 1150 Z offers contactless measurements on flats and spherical lenses. It can also be used for transmitted wavefront measurements of optical components and assemblies. Measurements may be made by means of simple interference fringe analysis or phase-modulated interferogram analysis. The established IntelliWave Software offers superior measurement and analysis capability. The MarOpto FI 1150 Z provides the versatility and reliability to handle today's advanced applications. Total USB connectivity option (laptop or desktop) with 1k x 1k true spatial resolution Excellent versatility, stability and repeatability 1x to 6x zoom, focus and attenuation controls Vibration-insensitivity can be accomplished via Mahr's IntelliPhase Static Spatial Carrier Acquisition and Analysis Software Compact, lightweight and rugged design Compatible with all industry standard 6" (150 mm) reference optics and accessories Configurations include horizontal, vertical look up and vertical look down. Optional workstations for flats and for radius of curvature measurements

  • 6x / 3x zoom for workpieces with a diameter of up to 1.5 mm
  • 3 modes of interferogram analysis: Phase shifting, IntelliPhase – static spatial carrier analysis, or fringe tracing (automated or manual)
  • Small size allows easy integration into OEM systems
  • Compact, rugged design
  • Transmission spheres from F / 0.7 to F / 6.0

 

 

Applications

  • Transmission and surface testing of small optics
  • Measurements on optics, machined parts, ceramics, semiconductors, and wafers
  • Integrated radius of curvature measurements

 

MarOpto FI 1100 Z Fizeau interferometer

MarOpto FI 1100 Z Fizeau interferometer

The MarOpto FI 1100 Z offers contactless measurements on flats and spherical lenses. It can also be used for transmitted wavefront measurements of optical components and assemblies. Measurements may be made by means of simple interference fringe analysis or phase-modulated interferogram analysis. The established IntelliWave Software offers superior measurement and analysis capability. The MarOpto FI 1100 Z provides the versatility and reliability to handle today’s advanced applications at unrivaled value for money.

 

 

 

  • Total USB connectivity option (laptop or desktop) with 1k x 1k true spatial resolution
  • Excellent versatility, stability and repeatability
  • 1x to 6x zoom, focus and attenuation controls
  • Vibration-insensitivity can be accomplished via Mahr’s IntelliPhase™ Static Spatial Carrier Acquisition and Analysis Software
  • Compact, lightweight and rugged design
  • Compatible with all industry standard 4″ (100 mm) reference optics and accessories
  • High accuracy measurements at an affordable price
  • Configurations include horizontal, vertical look up and vertical look down. Optional workstations for flats and for radius of curvature measurements

Applications

  • Measurement of flat, concave or convex surfaces
  • Prism, corner cube, wedge angle and homogeneity measurements
  • Measurement of machined, ceramic, and wafer surfaces
  • Wavefront analysis of optical systems & components
  • Integration into OEM systems

 

MarOpto FI 1150 Z Fizeau interferometer

MarOpto FI 1150 Z Fizeau interferometer

The MarOpto FI 1150 Z offers contactless measurements on flats and spherical lenses. It can also be used for transmitted wavefront measurements of optical components and assemblies. Measurements may be made by means of simple interference fringe analysis or phase-modulated interferogram analysis. The established IntelliWave Software offers superior measurement and analysis capability. The MarOpto FI 1150 Z provides the versatility and reliability to handle today’s advanced applications.

 

 

 

The MarOpto FI 1150 Z offers contactless measurements on flats and spherical lenses. It can also be used for transmitted wavefront measurements of optical components and assemblies. Measurements may be made by means of simple interference fringe analysis or phase-modulated interferogram analysis. The established IntelliWave Software offers superior measurement and analysis capability. The MarOpto FI 1150 Z provides the versatility and reliability to handle today's advanced applications. Total USB connectivity option (laptop or desktop) with 1k x 1k true spatial resolution Excellent versatility, stability and repeatability 1x to 6x zoom, focus and attenuation controls Vibration-insensitivity can be accomplished via Mahr's IntelliPhase Static Spatial Carrier Acquisition and Analysis Software Compact, lightweight and rugged design Compatible with all industry standard 6" (150 mm) reference optics and accessories Configurations include horizontal, vertical look up and vertical look down. Optional workstations for flats and for radius of curvature measurements

  • Total USB connectivity option (laptop or desktop) with 1k x 1k true spatial resolution
  • Excellent versatility, stability and repeatability
  • 1x to 6x zoom, focus and attenuation controls
  • Vibration-insensitivity can be accomplished via Mahr’s IntelliPhase Static Spatial Carrier Acquisition and Analysis Software
  • Compact, lightweight and rugged design
  • Compatible with all industry standard 6″ (150 mm) reference optics and accessories
  • Configurations include horizontal, vertical look up and vertical look down. Optional workstations for flats and for radius of curvature measurements

 

Applications

  • Measurement of flat, concave or convex surfaces
  • Prism, corner cube, wedge angle and homogeneity measurements
  • Measurement of machined, ceramic, and wafer surfaces
  • Wavefront analysis of optical systems components
  • Integration into OEM systems