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Helmut-Fischer FISCHERSCOPE X-RAY 5000, XRF for Inline measurements

X-ray fluorescence instrument as modular unit for integration in manufacturing plants, for example on a traversing beam. Ideally suited for the measurement of thin layers on large surfaces.

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FISCHERSCOPE X-RAY 5000

XRF for Inline measurements

 

The FISCHERSCOPE X-RAY 5000 can be integrated into manufacturing lines as a modular unit. Ideally suited for the inline measurement of thin layers on large surfaces.

Features

  • Continuous measurement during ongoing processes, with connection to production systems
  • Flexible application: for vacuum or air, on surfaces up to 400°C
  • Particularly robust design and construction for sustainably precise measurements under harsh conditions
  • Outstandingly well-suited to coating thickness measurement and material analysis on products with large surfaces

Applications

Coating Thickness Measurement

  • Thickness of CIGS, CIS, CdTe and CdS layers in the solar industry
  • Thin layers a few µm thick on metal strips, metallic foil and plastic foils

Material Analysis

  • Composition of CIGS, CIS, CdTe and CdS layers in photovoltaics
  • Metal coatings in continuous production processes
  • Process monitoring in sputter and electroplating plants